Assoc Eng Failure Analysis

Tasks

• Apply sample coating
• Communicate shift handover information
• Conduct pre FIB sample preparation
• Document work according to SOPs
• Ensure sample quality and thickness requirements
• Follow laboratory safety procedures
• Inspect wafers using optical microscope
• Operate focused ion beam systems
• Participate in continuous improvement
• Perform RIE polishing
• Perform TEM sample preparation
• Prepare lamella for TEM analysis
• Troubleshoot sample preparation issues

Perks/Benefits

• Night shift work

Skills/Tech-stack

Electron microscopy | FIB | Failure analysis | Focused Ion Beam | Ion Beam | Laboratory safety | Lamella preparation | Optical Microscopy | Polishing | Problem Solving | Quality Standards | RIE | SOP compliance | Sample coating | Sample preparation | Semiconductor Failure Analysis | TEM sample preparation | Transmission Electron Microscopy | Wafer cleaving